ملف:Hari Iyer and Soweon Yoon (15900343548).jpg
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| ⧼wm-license-information-description⧽ |
Hari Iyer (left), a faculty appointee (Colorado State University) in the NIST Statistical Engineering Division, and Soweon Yoon, NIST guest researcher from Michigan State University, are working to develop a statistical measure of uncertainty for decisions about forensic fingerprint comparisons. See www.nist.gov/itl/iad/ig/sfra.cfm. Credit: NIST Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST. Use of NIST Information: These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology (NIST). With the exception of material marked as copyrighted, information presented on these pages is considered public information and may be distributed or copied. Use of appropriate byline/photo/image credits is requested. |
| ⧼wm-license-information-date⧽ | 2014, {{time}} – invalid date format 29 (help) |
| ⧼wm-license-information-source⧽ | Hari Iyer and Soweon Yoon |
| ⧼wm-license-information-author⧽ | National Institute of Standards and Technology |
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| زمن/تاريخ | صورة مصغرة | الأبعاد | مستخدم | تعليق | |
|---|---|---|---|---|---|
| حالي | ★ مراجعة معتمدة 16:58، 2 ديسمبر 2023 | | 2٬000 × 1٬299 (1٫98 ميجابايت) | Pastakhov (نقاش | مساهمات) | Upload https://upload.wikimedia.org/wikipedia/commons/6/65/Hari_Iyer_and_Soweon_Yoon_%2815900343548%29.jpg |
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